A-53: Image-based cytometric analysis of fluorescent viability and vitality staining methods for Saccharomyces cerevisiae

L. L. CHAN (1), S. Saldi (1), D. Driscoll (2), D. Kuksin (1); (1) Nexcelom Bioscience, Lawrence, MA, U.S.A.; (2) Avery Brewing Company, Boulder, CO, U.S.A.

Poster

Saccharomyces cerevisiae, or yeast, has been an essential component for the production of beer for centuries. The viability and vitality of yeast during standard brewing processes is especially important for proper cell growth, consistent production of flavor, and optimal yield for fermentation. Traditional methods for yeast viability measurement depend on mainly manual counting of methylene blue-stained yeast cells in a hemacytometer. However, this method can be time-consuming and has user-dependent variations. In recent years, fluorescent viability and vitality stains have become widely used for flow and image-based cytometry methods. Specifically for image cytometry, it has been previously demonstrated for rapid yeast concentration and viability measurements. In this work, we demonstrate the capability of cellometer vision image cytometry to measure yeast viability and vitality, validating the methods against methylene blue. Various fluorescent stains were employed for viability and vitality measurement, such as nucleic acid stains (PI, EB, 7-AAD, and DAPI); membrane potential, intracellular, and enzymatic stains (oxonol, MgANS, and CFDA-AM); and dual-fluorescent stains (AO/PI and CFDA-AM/PI). In addition, we performed a time-course viability and vitality study to compare the physiological changes in lager and ale yeast in order to understand yeast behavior during a standard fermentation process.

Leo Chan currently serves as the technology R&D manager at Nexcelom Bioscience LLC, Lawrence, MA. His research involves the development of instruments and applications for the Cellometer image cytometry system for detection and analysis of yeasts used in brewing and biofuel industries. He is a member of the Master Brewers Association of the Americas. He received his B.S., M.S., and Ph.D. degrees in electrical and computer engineering from the University of Illinois at Urbana-Champaign (2000–2008).

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